碳化硅灭磁电阻温度特性的离线检测方法

华电技术 ›› 2012, Vol. 34 ›› Issue (12): 61-63.

碳化硅灭磁电阻温度特性的离线检测方法

傅煜

中核集团福建福清核电有限公司，福建福清350318

收稿日期:1900-01-01 修回日期:1900-01-01 出版日期:2012-12-25

Offline detection method of temperature characteristics of SiC deexcitation resistor

FU Yu

Fujian Fuqing Nuclear Power Company Limited of China National Nuclear Corporation, Fuqing 350318, China

Received:1900-01-01 Revised:1900-01-01 Published:2012-12-25

摘要/Abstract

摘要： 碳化硅灭磁电阻是由多片碳化硅电阻串、并联组成，其均流和均能特性可通过温度特性考核。针对目前碳化硅灭磁电阻温度特性，提出了一种离线检测的新方法，该方法既经济实用又安全简单。

关键词: 碳化硅灭磁电阻, 温度特性, 均温系数, 离线检测

Abstract: The SiC deexcitation resistor is constituted by multiple SiC resistor chips connected in serialparallel mode. Their current equalizing and energy equalizing performances can be examined by temperature characteristics. Aiming at the temperature characteristics of current SiC deexcitation resistors, a new offlinedetection method was proposed. The new method is economical, practical, safe and simple.

Key words: SiC deexcitation resistor, temperature characteristics, temperature equalizing coefficient, off-line detection

傅煜. 碳化硅灭磁电阻温度特性的离线检测方法[J]. 华电技术, 2012, 34(12): 61-63.

FU Yu. Offline detection method of temperature characteristics of SiC deexcitation resistor[J]. Huadian Technology, 2012, 34(12): 61-63.